Parag K. Lala digital circuits, logic circuit testing, VLSI, fault detection, design- for-testability, chapter also discusses test generation for sequential circuits. Digital circuit testing and testability by Parag K. Lala, , Academic Press edition, in English. Get this from a library! Digital circuit testing and testability. [Parag K Lala].
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Digital circuit testing and testability
Digital circuit testing and testability by Parag K. Search WorldCat Find items in libraries near you.
Copy and paste this code into your Wikipedia page. This text reviews many different techniques and methodologies to show how to design systems that are fault tolerant. Tina Bhati rated it it was amazing Oct 17, This text reviews many different techniques and methodologies to show how to design systems that circuitt fault tolerant.
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Digital Circuit Testing and Testability by Parag K. Lala
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Digital Circuit Testing and Testability
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There are no discussion topics on this book yet. Angeline rated it liked it Oct 29, There’s no description for this book yet. It presents coverage of self checking logic design at the gate and the transistor level; discusses the latest techniques for testing state machines; and includes detailed coverage of memory testing.
Digital circuit testing and testability (Book, ) 
Are you sure you want to remove Digital circuit testing and testability from your list? Laka to Read Currently Reading Read. You might also like. Please verify that you are not a robot. Test Generation for Sequential Circuits — Ch.